Conduction properties of silicon dioxide in oxide-nitride-oxide structures
- 30 June 1987
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 30 (6) , 587-591
- https://doi.org/10.1016/0038-1101(87)90216-4
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Properties of MNOS structuresIEEE Transactions on Electron Devices, 1972