Abstract
Previously reported infrared spectra of amorphous SiO2 have been discussed in order to clarify the origin of the shoulder at ∼ 1200 cm1 in the transmission spectra and of the high-frequency band at ∼ 1260 cm1 in the reflection spectra. Infrared measurements at oblique incidence with s- and p-polarized light show that the high-frequency response of silica (between ∼ 1000 and 1300 cm1) originates from two coupled modes AS1 and AS2. The polarization characteristics indicate that the features at ∼ 1200 cm1 and ∼ 1260 cm1 have different origin and that it is appropriate to attribute to them TO (AS2) and LO (AS1) character, respectively. This assignment was found to be consistent with the infrared-reflectance measurements at oblique incidence reported by Almeida [Phys. Rev. B 45, 161 (1992)] and with those at nearly normal incidence reported by Kamitsos et al. and analyzed by Kramers-Kronig transformation [Phys. Rev. B 48, 12 499 (1993)]. The two-mode interpretation of the high-frequency response of silica was found to be consistent with the trends of the effective transverse-optic and longitudinal-optic frequencies, which were calculated using the second-moment expressions of Noh and Sievers [Phys. Rev. Lett. 17, 1800 (1989)].