Correction of errors in electron stereomicroscopy

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Abstract
A method is described for analysing electron stereomicrographs. Three position co-ordinates are computed for each object point from the four co-ordinate measurements (two from each micrograph) that are available for each point from the stereo pair. The method allows for the correction of tilt error and perspective error, and for the estimation of the magnitude of the errors that remain. An example of the application of the method is described.

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