Threshold studies of secondary electron emission induced by macro-ion impact on solid surfaces
- 15 March 1980
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 170 (1-3) , 309-315
- https://doi.org/10.1016/0029-554x(80)91031-9
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Low noise, high voltage secondary emission ion detector for polyatomic ionsInternational Journal of Mass Spectrometry and Ion Physics, 1977
- Secondary electron emission induced by 5–30-keV monatomic ions striking thin oxide filmsJournal of Applied Physics, 1975
- Studies of plasma production at hypervelocity microparticle impactJournal of Physics D: Applied Physics, 1973
- Energy Dissipation by Ions in the kev RegionPhysical Review B, 1961