Quantitative trace element analyses in thick samples with heavy-ion-induced x-ray fluorescence
- 1 October 1973
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 44 (10) , 4749-4752
- https://doi.org/10.1063/1.1662030
Abstract
A procedure is described for obtaining quantitative analysis of trace elements in a thick sample by heavy‐ion‐induced x‐ray fluorescence. The method avoids difficulties involved in preparing thin uniform samples and yields absolute abundances of impurity elements without utilizing internal standards.This publication has 1 reference indexed in Scilit:
- X-Ray Production by Alpha-Particle ImpactPhysical Review A, 1971