High-Accuracy Wide-Range Measurement Method for Determination of Complex Permittivity in Reentrant Cavity: Part A --- Theoretical Analysis of the Method
- 1 March 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 28 (3) , 225-228
- https://doi.org/10.1109/tmtt.1980.1130045
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Microwave properties of n-type InSb in a magnetic field between 4 and 300 °KJournal of Applied Physics, 1973
- Cavity Perturbation Techniques for Measurement of the Microwave Conductivity and Dielectric Constant of a Bulk Semiconductor MaterialIEEE Transactions on Microwave Theory and Techniques, 1972
- The measurement of permittivity and power factor of dielectrics at frequencies from 300 to 600 Mc/sProceedings of the IEE - Part II: Power Engineering, 1951