Combined shear force and near-field scanning optical microscopy
- 18 May 1992
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 60 (20) , 2484-2486
- https://doi.org/10.1063/1.106940
Abstract
A distance regulation method has been developed to enhance the reliability, versatility, and ease of use of near‐field scanning optical microscopy (NSOM). The method relies on the detection of shear forces between the end of a near‐field probe and the sample of interest. The system can be used solely for distance regulation in NSOM, for simultaneous shear force and near‐field imaging, or for shear force microscopy alone. In the latter case, uncoated optical fiber probes are found to yield images with consistently high resolution.Keywords
This publication has 13 references indexed in Scilit:
- Scanned-tip reflection-mode near-field scanning optical microscopyUltramicroscopy, 1991
- Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric ScaleScience, 1991
- An Evanescent Field Optical MicroscopePublished by SPIE-Intl Soc Optical Eng ,1989
- Scanning tunneling optical microscopyOptics Communications, 1989
- New form of scanning optical microscopyPhysical Review B, 1989
- Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles And Some Recent DevelopmentsPublished by SPIE-Intl Soc Optical Eng ,1988
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- Super-resolution fluorescence near-field scanning optical microscopyApplied Physics Letters, 1986
- Near-field optical-scanning microscopyJournal of Applied Physics, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986