Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films
- 1 October 1984
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 17 (10) , 896-903
- https://doi.org/10.1088/0022-3735/17/10/023
Abstract
Inhomogeneities in thin films have a large influence on the optical transmission spectrum. If not corrected for, this may lead to too large calculated values for the absorption coefficient or the apparent presence of an absorption band tail as well as serious errors in the values of refractive index and thickness. The effects of thickness variation, surface roughness and variation in refractive index on the transmission spectrum are analysed. Analytical expressions are derived from which all the optical constants of an inhomogeneous film can be calculated from the transmission spectrum.Keywords
This publication has 5 references indexed in Scilit:
- Determination of the thickness and optical constants of amorphous siliconJournal of Physics E: Scientific Instruments, 1983
- A method for the determination of the complex refractive index of non-metallic thin films using photometric measurements at normal incidenceThin Solid Films, 1983
- Optical properties of thin amorphous silicon and amorphous hydrogenated silicon films produced by ion beam techniquesThin Solid Films, 1983
- Optical constants of rf sputtered hydrogenated amorphous SiPhysical Review B, 1979
- Optical absorption in D.C. sputtered InAs filmsThin Solid Films, 1977