Double-Scanning Diffractometry in the Back-Reflection Region
- 1 January 1965
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- The practical determination of lattice parameters using the centroid methodBritish Journal of Applied Physics, 1963
- Precision X-Ray Diffractometry Using Powder SpecimensPublished by Springer Nature ,1963
- Precision Lattice-Parameter Determination by Double-Scanning DiffractometryPublished by Springer Nature ,1962
- Results of the IUCr precision lattice-parameter projectActa Crystallographica, 1960
- Geiger-Counter X-Ray Spectrometer - Influence of Size and Absorption Coefficient of Specimen on Position and Shape of Powder Diffraction MaximaJournal of Scientific Instruments, 1950