Precision X-Ray Diffractometry Using Powder Specimens
- 1 January 1963
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- Results of the IUCr precision lattice-parameter projectActa Crystallographica, 1960
- The intensity distribution in the focus of curved-crystal monochromators and an estimate of its influence on precision measurements of lattice parametersActa Crystallographica, 1960
- Counter diffractometer – the effect of dispersion, Lorentz and polarization factors on the positions of X-ray powder diffraction linesActa Crystallographica, 1959
- Some problems in the definition of wavelengths in x-ray crystallography*Zeitschrift für Kristallographie, 1959
- Effect of Absorption on Mean Wavelength of X-ray Emission LinesProceedings of the Physical Society, 1958
- Counter diffractometer - the effect of vertical divergence on the displacement and breadth of powder diffraction linesJournal of Scientific Instruments, 1957
- Effect of Dispersion and Geometric Intensity Factors on X-Ray Back-Reflection Line ProfilesJournal of Applied Physics, 1956
- Geiger-Counter X-Ray Spectrometer - Influence of Size and Absorption Coefficient of Specimen on Position and Shape of Powder Diffraction MaximaJournal of Scientific Instruments, 1950
- Errata in Lonsdale's Structure Factor TablesActa Crystallographica, 1950
- On the correction of lattice spacings for refractionMathematical Proceedings of the Cambridge Philosophical Society, 1940