Counter diffractometer - the effect of vertical divergence on the displacement and breadth of powder diffraction lines
- 1 September 1957
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 34 (9) , 355-363
- https://doi.org/10.1088/0950-7671/34/9/304
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Comparaison de deux méthodes de détermination des constantes de réseau à l'aide d'un diffractomètre à rayons XActa Crystallographica, 1956
- A monitored Geiger-counter X-ray powder diffractometer with automatic recordingJournal of Scientific Instruments, 1956
- Effect of vertical divergence on the displacement and breadth of X-ray powder diffraction linesBritish Journal of Applied Physics, 1952
- Geiger-Counter X-Ray Spectrometer - Influence of Size and Absorption Coefficient of Specimen on Position and Shape of Powder Diffraction MaximaJournal of Scientific Instruments, 1950
- Discussion of ``Geometrical Factors Affecting X-Ray Spectrometer Maxima''Journal of Applied Physics, 1949
- On the correction of lattice spacings for refractionMathematical Proceedings of the Cambridge Philosophical Society, 1940
- A New Precision X-ray SpectrometerPhysical Review B, 1924