Noise in ion implanted integrated circuit resistors
- 1 February 1977
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 20 (2) , 164-165
- https://doi.org/10.1016/0038-1101(77)90068-5
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Excess noise measurements in ion-implanted silicon resistorsSolid-State Electronics, 1974