Quantitative comparison of direct and derivative AES with XPS of metal sulfides
- 1 October 1982
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 4 (5) , 197-203
- https://doi.org/10.1002/sia.740040505
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Backscattering correction for quantitative Auger analysis: I. Monte Carlo calculations of backscattering factors for standard materialsSurface Science, 1981
- AES and XPS spectra of sulfur in sulfur compoundsApplications of Surface Science, 1981
- Electron beam damage in Auger electron spectroscopyApplications of Surface Science, 1981
- XPS studies of ion-bombardment damage of transition metal sulfidesJournal of Electron Spectroscopy and Related Phenomena, 1980
- A secondary electron emission correction for quantitative auger yield measurementsSurface Science, 1980
- Recent progress in quantification of surface analysis techniquesApplications of Surface Science, 1980
- Quantitative Auger electron spectroscopy: Via the energy spectrum or the differential?Surface and Interface Analysis, 1979
- Matrix effects in quantitative auger analysis of dilute alloysSurface Science, 1979
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979
- Relative sensitivity factors for quantitative Auger analysis of binary alloysSurface Science, 1977