Structure determination of CdS and ZnS nanoparticles: Direct modeling of synchrotron-radiation diffraction data
- 8 December 2005
- journal article
- research article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 123 (22) , 224707
- https://doi.org/10.1063/1.2129369
Abstract
We introduce a modified method of powder-diffraction data analysis to obtain precise structural information on freestanding and nanoparticles with diameters well below , i.e., in a range where common bulk-derived approaches fail. The method is based on the Debye equation and allows us to access the crystal structure and the size of the particles with high precision. Detailed information on strain, relaxation effects, stacking faults, and the shape of the particles becomes available. We find significant size differences between our new results and those obtained by established methods, and conclude that a mixed zinc-blende/wurtzite stacking and significant lattice distortions occur in our nanoparticles. Our approach should have direct impact on the understanding and modeling of quantum size effects in nanoparticles.
Keywords
This publication has 30 references indexed in Scilit:
- Structural investigation of thesurfacePhysical Review B, 2003
- Enhancement of photoluminescence in manganese-doped ZnS nanoparticles due to a silica shellThe Journal of Chemical Physics, 2003
- Structure of metal-rich (001) surfaces of III-V compound semiconductorsPhysical Review B, 2001
- “Quantum-confined atoms”: novel luminescent centers for future II–VI devicesJournal of Crystal Growth, 2000
- Shape Change as an Indicator of Mechanism in the High-Pressure Structural Transformations of CdSe NanocrystalsPhysical Review Letters, 2000
- PowderX: Windows-95-based program for powder X-ray diffraction data processingJournal of Applied Crystallography, 1999
- Structures and electronic transport on silicon surfacesProgress in Surface Science, 1999
- Oxygen and nitrogen interaction with rhodium single crystal surfacesSurface Science Reports, 1998
- Integrated Intensities Using a Six-Circle Surface X-ray DiffractometerJournal of Applied Crystallography, 1997
- Size Quantization in Electrodeposited CdTe Nanocrystalline FilmsThe Journal of Physical Chemistry B, 1997