A Spiral-Scanning X-Ray Reflection Goniometer for the Rapid Determination of Preferred Orientations
- 1 January 1953
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 24 (1) , 10-12
- https://doi.org/10.1063/1.1770508
Abstract
A goniometer has been designed to rapidly scan polycrystalline metal samples along a spiral path in a stereographic projection, and which, when used with any recording counting‐rate meter available on a modern x‐ray spectrometer, enables the rapid determination of the preferred crystal orientations of the sample.Keywords
This publication has 2 references indexed in Scilit:
- Analysis of Certain Errors in the X-Ray Reflection Method for the Quantitative Determination of Preferred OrientationsJournal of Applied Physics, 1952
- A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray SpectrometerJournal of Applied Physics, 1949