Yoke flux reversal time in thin-film write heads
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 31 (6) , 2657-2659
- https://doi.org/10.1109/20.490083
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- The effect of rise time and field gradient on nonlinear bit shift in thin film headsIEEE Transactions on Magnetics, 1994
- Considerations for high data rate recording with thin-film headsIEEE Transactions on Magnetics, 1990