LSI chip design for testability

Publisher Website

1 January 1978

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/isscc.1978.1155765

Abstract

No abstract available

This publication has 2 references indexed in Scilit:

Diagnostics for logic networks
IEEE Spectrum, 1973
Diagnosis of Automata Failures: A Calculus and a Method
IBM Journal of Research and Development, 1966