Diagnostics for logic networks

Publisher Website

1 October 1973

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Spectrum

Vol. 10 (10) , 40-47
https://doi.org/10.1109/mspec.1973.5216474

Abstract

No abstract available

Keywords

This publication has 6 references indexed in Scilit:

Testing for Intermittent Faults in Digital Circuits
IEEE Transactions on Computers, 1973
Algorithms ror Designing Fault-Detection Experiments ror Sequential Machines
IEEE Transactions on Computers, 1973
Recent developments in the automated design and analysis of digital systems
Proceedings of the IEEE, 1972
Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks
IEEE Transactions on Computers, 1971
Test and Diagnosis Procedure for Digital Networks
Computer, 1971
Fault Diagnosis of Digital Systems - a Review
Computer, 1971