Ferromagnetic resonance linewidth of Fe ultrathin films grown on a bcc Cu substrate
- 15 November 1991
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 70 (10) , 5935-5937
- https://doi.org/10.1063/1.350110
Abstract
The ferromagnetic resonance (FMR) linewidth ΔH is a parameter used to characterize ultrathin film quality. The frequency-independent part, ΔH(0), reflects the contribution of magnetic inhomogeneities. The linear part is caused by the intrinsic Gilbert damping mechanism. Recently we have found that the lattice reconstructions of substrate templates strongly affects the FMR linewidth. bcc Fe(001) films (∼10 ML) were grown on unreconstructed fcc Ag(001), bcc Cu(001), and on surface reconstructed bcc Cu(001) templates. Fe layers grown on unreconstructed Cu templates exhibited an isotropic FMR linewidth. Fe layers grown on reconstructed Cu templates, on the contrary, showed an anisotropic behavior in both the zero-frequency FMR linewidth and the intrinsic damping parameter. Other magnetic parameters such as uniaxial and 4-fold anisotropies are also discussed.This publication has 11 references indexed in Scilit:
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