Refractive indices of InAlAs and InGaAs/InP from 250 to 1900 nm determined by spectroscopic ellipsometry
- 1 January 1992
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 54, 477-481
- https://doi.org/10.1016/0169-4332(92)90090-k
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Optical properties of from 1.5 to 6.0 eV determined by spectroscopic ellipsometryPhysical Review B, 1982
- Optical properties of In1−xGaxP1−yAsy, InP, GaAs, and GaP determined by ellipsometryJournal of Applied Physics, 1982
- Refractive Index of InPJournal of Applied Physics, 1965