Non-destructive characterisation of (Ga,In,Al,As,P)-based ternary multilayer structures using spectroscopic ellipsometry
- 1 June 1991
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 50 (1-4) , 346-352
- https://doi.org/10.1016/0169-4332(91)90196-q
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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