Markov model for k-out-of-n:G systems with built-in-test
- 1 January 1991
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 31 (1) , 123-131
- https://doi.org/10.1016/0026-2714(91)90356-c
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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