Abstract
The anodic oxidation of copper in a copper sulphate bath has been performed. From gravimetric measurements of the thickness of the cuprous oxide layer formed, it is observed that the growth law for anodic oxide thin film formation is a power law. The cuprous oxide diodes fabricated by the above technique have been studied using current-voltage and capacitance-voltage methods. From these it is inferred that the resulting device is characteristic of a metal-insulator-semiconductor (MIS) diode.