A new method of analysis of DLTS-spectra
- 1 October 1987
- journal article
- research article
- Published by Springer Nature in Applied Physics A
- Vol. 44 (2) , 107-110
- https://doi.org/10.1007/bf00626409
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Method of Analysis of a Single-Peak DLTS spectrum with Two Overlapping Deep-Trap ResponsesJapanese Journal of Applied Physics, 1986
- A deep level transient spectroscopy analysis of electron and hole traps in bulk-grown GaAsJournal of Applied Physics, 1986
- On the Role of the Back Contact in DLTS Experiments with Schottky DiodesPhysica Status Solidi (a), 1985
- Point Defects in Semiconductors IIPublished by Springer Nature ,1983
- Deep-level transient spectroscopy: A new method to characterize traps in semiconductorsJournal of Applied Physics, 1974