Operation and mass resolution of a time-of-flight mass spectrometer with electron impact ionization and rapid field reversal
- 31 August 1984
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 59 (3) , 247-259
- https://doi.org/10.1016/0168-1176(84)85100-9
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Time-of-flight mass spectrometry with rapid field reversal: High transmission with continuous electron impact ionizationInternational Journal of Mass Spectrometry and Ion Processes, 1984
- Apparatus with nanosecond field transition times for field reversal studies of surface processes at high temperaturesReview of Scientific Instruments, 1981
- Simple surface ionization detector with field reversal for absolute ionization coefficient and ionic and neutral desorption measurementsReview of Scientific Instruments, 1976
- Surface ionization molecular beam detector with a magnetic mass filter: application to absolute differential reactive cross section measurementsJournal of Physics E: Scientific Instruments, 1976
- Molecular beam surface ionization detection: I. Absolute ionization coefficients and work function of “low work function” Pt(8%W) surfacesSurface Science, 1976