Interaction forces of a sharp tungsten tip with molecular films on silicon surfaces

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Abstract
An atomic-force microscope was used to measure the surface forces between a sharp tungsten tip and several different types of molecularly thin organic films on a silicon substrate. The forces are dramatically influenced by the molecular films covering the surfaces. The films investigated fall into three categories: liquid for unbound films of perfluoropolyether, intermediate for bonded films of perfluoropolyether, and soft solid for multilayers of cadmium arachidate. Molecular-level origins of these forces are discussed.