Improved fiber-optic interferometer for atomic force microscopy
- 18 December 1989
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 55 (25) , 2588-2590
- https://doi.org/10.1063/1.101987
Abstract
A high‐sensitivity fiber‐optic displacement sensor for atomic force microscopy is described. The sensor is based on the optical interference occurring in the micron‐sized cavity formed between the cleaved end of a single‐mode optical fiber and the microscope cantilever. As a result of using a diode laser light source and all‐fiber construction, the sensor is compact, mechanically robust, and exhibits good low‐frequency noise behavior. Peak‐to‐peak noise in a dc to 1 kHz bandwidth is less than 0.1 Å. Images are presented demonstrating atomic resolution of graphite and magnetic force imaging of bits written on a magnetic disk.Keywords
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