Cryostat for measuring the electrical properties of high resistance semiconductors at low temperatures
- 1 March 1959
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 36 (3) , 134-136
- https://doi.org/10.1088/0950-7671/36/3/308
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Electrical Conduction in p-Type InSb between 100 and 2 kProceedings of the Physical Society, 1959
- The Electrical Conductivity and Hall Effect of SiliconProceedings of the Physical Society, 1958
- The low temperature electrical conductivity of n-type germaniumJournal of Physics and Chemistry of Solids, 1957
- Electrical Properties of Germanium Semiconductors at Low TemperaturesPhysical Review B, 1955
- Carbon Resistor ThermometersProceedings of the Physical Society. Section B, 1955
- Electrical Properties of Silicon Containing Arsenic and BoronPhysical Review B, 1954
- Design of Dynamic Condenser ElectrometersReview of Scientific Instruments, 1947