Elimination of the background in high-precision Compton profile analysis
- 1 September 1974
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 45 (9) , 4100-4102
- https://doi.org/10.1063/1.1663918
Abstract
The Compton spectrum of Cu and Al with AgK radiation is discussed and a method is described to separate the large disturbing background of the Compton scattering of the white spectrum by convolution integrals. In spite of this highly sophisticated analysis of the background it still provides a main source of error. Therefore a new method with AgK fluorescence radiation is described and preliminary results are given. Now the background is wavelength independent and reduced by a factor of 35 for LiF (200) and Al scatterer. As an example of the great progress of this new method, the Compton profiles of Al and paraffin are discussed. The Compton intensity is nearly the same as with the older method.This publication has 4 references indexed in Scilit:
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