Thickness dependence of signal/background ratio of inner-shell electron excitation loss in eels
- 31 December 1984
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 13 (3) , 329-332
- https://doi.org/10.1016/0304-3991(84)90211-0
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Measurement of partial specific thickness (net thickness) of critical-point-dried cultured fibroblast by energy analysisUltramicroscopy, 1981
- Formulae for light-element micro analysis by electron energy-loss spectrometryUltramicroscopy, 1978
- Contribution of electron energy loss spectroscopy to the development of analytical electron microscopyUltramicroscopy, 1976