An Acoustic Microscope for Surface Characterization

Publisher Website

1 January 1981

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 561-564
https://doi.org/10.1109/ultsym.1981.197684

Abstract

No abstract available

Keywords

This publication has 4 references indexed in Scilit:

Effects of high angles of convergence on V(z) in the scanning acoustic microscope.
Applied Physics Letters, 1981
Acoustic Microscopy Applied to SAW Dispersion and Film Thickness Measurement
IEEE Transactions on Sonics and Ultrasonics, 1980
Effect of shear-wave polarization on defect detection in stainless steel weld metal
Ultrasonics, 1978
Phase imaging in reflection with the acoustic microscope
Applied Physics Letters, 1977