Semiconductor photodiodes in the VUV: Determination of layer thicknesses and design criteria for improved devices
- 1 March 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 288 (1) , 114-118
- https://doi.org/10.1016/0168-9002(90)90474-k
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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