Excess Noise in Amorphous Selenium Avalanche Photodiodes
- 1 June 1991
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 30 (6B) , L1071
- https://doi.org/10.1143/jjap.30.l1071
Abstract
Excess noise in amorphous Selenium avalanche photodiodes (a-Se APD) has been measured in a frequency range from 3 kHz to 30 kHz. The deduced excess noise factors, including dependences on photocurrent, frequency, applied electric field and the a-Se layer's thickness, agreed with McIntyre's theoretical values.Keywords
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