Uniaxial Stress Effect of Ge p-n Junctions
- 1 April 1965
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 4 (4)
- https://doi.org/10.1143/jjap.4.309
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Minority Carrier Lifetime in Uniaxially Stressed GermaniumJapanese Journal of Applied Physics, 1965
- Effect of Mechanical Stress on p-n Junction Device CharacteristicsJournal of Applied Physics, 1964
- Anisotropic Stress Effect of Silicon pn JunctionsJapanese Journal of Applied Physics, 1964
- Resistance of Elastically Deformed Shallow p-n Junctions. IIJournal of Applied Physics, 1963