Contrast arising from elastic and inelastic scattering in the electron microscope

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Abstract
The contrast due to elastic and inelastic scattering of electrons in the electron microscope is calculated on a wave-optical basis. Various approximations are made, especially in the case of inelastic scattering where additional scattering data is required for a rigorous analysis. It is shown that the major contribution to contrast arises from the gap left in the illuminating wavefront by the inelastically scattered electrons. The next most important effect is by phase contrast with elastic scattering. In-phase or amplitude contrast is very small, and the inelastically scattered electrons have little effect except for extended objects.

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