SIMS instrumentation and imaging techniques
- 1 January 1980
- Vol. 3 (2) , 79-89
- https://doi.org/10.1002/sca.4950030203
Abstract
No abstract availableKeywords
This publication has 44 references indexed in Scilit:
- Mass spectrometry of solids ? with special emphasis on probe samplingMicrochimica Acta, 1978
- Ion and electron trajectories in mirror-type ion-electron convertersNuclear Instruments and Methods, 1976
- Secondary-ion emission of amino acidsApplied Physics B Laser and Optics, 1976
- Sputtering of Iron with Ion Beams of O2+, N2+and Ar+Japanese Journal of Applied Physics, 1976
- Ion probe microanalysisJournal of Physics E: Scientific Instruments, 1975
- High mass resolution ion microprobe mass spectrometry of complex matricesAnalytical Chemistry, 1975
- Ion microprobe analysers. History and outlookAnalytical Chemistry, 1974
- Analyses de couches minces de silice par emission ionique secondaireMaterials Research Bulletin, 1971
- Über ein Ionenmikroskop zur Untersuchung von biologischen GewebeschnittenAnnalen der Physik, 1957
- The formation of negative ions by positive-ion impact on surfacesProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1938