Detecting stuck-open faults with stuck-at test sets
- 1 January 1989
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 13, 22.3/1-22.3/4
- https://doi.org/10.1109/cicc.1989.56809
Abstract
Simulations of CMOS combinational circuits have been conducted to determine the relationship between stuck-at and stuck-open fault coverage. The results suggest that node activity is more important to stuck-open fault coverage than test length by itself. Reordering test sets so that node activity is increased resulted in increased stuck-open fault coverage. It is important to note that the reordering of the test sets requires an analysis of fault-free simulations; no fault simulations need to be done. It has been shown that all but some minimum-length test sets can easily achieve the 75% stuck-open fault coverage required by the DoD (US Department of Defense), and pseudorandom tests, which have high measures of node activity, can be expected to have over 90% stuck-open fault coverageKeywords
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