A correlation of atomic and electrical measurements of Cr and residual donors in thermally processed semi-insulating GaAs
- 30 June 1983
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 26 (6) , 565-567
- https://doi.org/10.1016/0038-1101(83)90172-7
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Chromium profiles in semi-insulating GaAs after annealing with a Si3N4 encapsulantApplied Physics Letters, 1979