Stability of Straight Delamination Blisters
- 15 November 1999
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 83 (20) , 4124-4127
- https://doi.org/10.1103/physrevlett.83.4124
Abstract
We consider the buckle-driven delamination of biaxially compressed thin films. Telephone-cord-like patterns observed in experiments are explained as a result of the buckling behavior of the film. We perform a stability analysis of a straight blister. A mechanism of instability causing undulations in an advancing finger of delamination is pointed out, which we claim to be the basic phenomenon explaining the zigzag pattern. We predict a transition to a varicose (unobserved as yet) pattern at low Poisson ratios.Keywords
This publication has 12 references indexed in Scilit:
- Pattern formation during delamination and buckling of thin filmsPhysical Review E, 1999
- Crumpled paperProceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, 1997
- Stress Condensation in Crushed Elastic ManifoldsPhysical Review Letters, 1997
- Delamination of Compressed Thin FilmsPublished by Elsevier ,1997
- Boundary layer analysis of the ridge singularity in a thin platePhysical Review E, 1996
- Growth and configurational stability of circular, buckling-driven film delaminationsActa Metallurgica et Materialia, 1992
- Buckle formation in vacuum-deposited thin filmsThin Solid Films, 1991
- Mixed Mode Cracking in Layered MaterialsPublished by Elsevier ,1991
- Buckling instability and adhesion of carbon layersThin Solid Films, 1984
- Theory of Elasticity: Vol. 7 of Course of Theoretical PhysicsPhysics Today, 1960