Pattern formation during delamination and buckling of thin films
- 1 March 1999
- journal article
- Published by American Physical Society (APS) in Physical Review E
- Vol. 59 (3) , R2542-R2545
- https://doi.org/10.1103/physreve.59.r2542
Abstract
No abstract availableThis publication has 25 references indexed in Scilit:
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