A new formula for secondary emission yield
- 1 September 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 36 (9) , 1963-1967
- https://doi.org/10.1109/16.34278
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Comparative study of secondary-electron emission from positron and electron bombardment of Ni, Si, and MgOPhysical Review B, 1988
- Secondary electron emission characteristics of oxidized beryllium cathodesSurface and Interface Analysis, 1988
- Carbon and carbon-coated electrodes for multistage depressed collectors for electron-beam devices—A technology reviewIEEE Transactions on Electron Devices, 1986
- Dependence of secondary-electron emission from amorphous materials on primary angle of incidenceJournal of Applied Physics, 1981
- The secondary electron emission coefficient of disordered surfacesSurface Science, 1980
- Theory of Secondary EmissionPhysical Review B, 1957