Secondary electron emission characteristics of oxidized beryllium cathodes

This publication has 10 references indexed in Scilit:

• Analysis of oxygen on and in beryllium using 2 MeV helium ions
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
• Bonding information from Auger spectroscopy
  Applications of Surface Science, 1985
• Auger lineshape analysis of carbon bonding in sputtered metal-carbon thin films
  Surface Science, 1983
• Comparison of Auger signals measured using differential and integral Auger spectra from C and O adsorbed on W
  Journal of Vacuum Science and Technology, 1978
• Electron-beam induced reduction of carbon concentration on BeO and its effects on secondary electron emission
  Surface Science, 1973
• Fast, Accurate Secondary-Electron Yield Measurements at Low Primary Energies
  Review of Scientific Instruments, 1973
• The continuous-cathode (emitting-sole) crossed-field amplifier
  Proceedings of the IEEE, 1973
• Contaminants on chemically etched silicon surfaces: LEED-Auger method
  Surface Science, 1970
• Identification of the form of carbon at a Si (100) surface using auger electron spectroscopy
  Physics Letters A, 1970
• The dissociative electronic desorption of carbon monoxide from tungsten
  Surface Science, 1968