Sensitive Technique for Measuring Differences in Reflectivity
- 1 August 1974
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 13 (8) , 1956-1958
- https://doi.org/10.1364/ao.13.001956
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 4 references indexed in Scilit:
- Optical properties and electronic structure of ordered and disorderedAuPhysical Review B, 1974
- Modulated Reflectivity Measurements on-phase Cu-Zn, Cu-Al, Cu-Ga, and Cu-Ge AlloysPhysical Review B, 1973
- A ``Differential Reflectometer'' for Measurements of Small Differences in ReflectivityReview of Scientific Instruments, 1973
- Photon-Surface-Plasmon Coupling in Thick Ag FoilsPhysical Review B, 1969