Ferroelectric field effect of a thin NaNO2-layer on a Si-substrate
- 1 July 1986
- journal article
- research article
- Published by Taylor & Francis in Ferroelectrics
- Vol. 69 (1) , 223-230
- https://doi.org/10.1080/00150198608008195
Abstract
Ferroelectric single crystalline NaNO2-layers are grown from the melt onto Si-FET substrates. The pyroelectric signal appearing across the NaNO2-Layer upon a temperature change of the NaNO2 is observed to induce a change in conductance of the source-drain channel in the adjacent Si-FET. The deposition of the NaNO2-layer on the Si-FET constitutes the integration of the pyroelectric NaNO2 radiation sensor with an impedance transformer. This appears as an important step towards the realization of a pyroelectric sensor array integrated into circuits on a Si-substrate for processing the sensor signals.Keywords
This publication has 6 references indexed in Scilit:
- NaNO2layers as pyroelectric radiation detectorsFerroelectrics, 1981
- PbTiO3ferroelectric thin film gate fet for infrared detectionFerroelectrics, 1981
- Ferroelectric properties of thin NaNO2–layersFerroelectrics, 1981
- Memory retention and switching behavior of metal-ferroelectric-semiconductor transistorsFerroelectrics, 1976
- Ferroelectric field-effect memory device using Bi4Ti3O12 filmJournal of Applied Physics, 1975
- A new solid state memory resistorIEEE Transactions on Electron Devices, 1963