Refractive index profile measurement techniques by reflectivity profiling: vidicon imaging, beam scanning, and sample scanning
- 20 October 1990
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 29 (30) , 4468-4472
- https://doi.org/10.1364/ao.29.004468
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
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