Calculation of parameter values from node voltage measurements
- 1 July 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems
- Vol. 26 (7) , 466-474
- https://doi.org/10.1109/tcs.1979.1084660
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- A method for the computation of large tolerance effectsIEEE Transactions on Circuit Theory, 1973
- Fault isolation via components simulationIEEE Transactions on Circuit Theory, 1972
- Fault Identification in Electronic Circuits with the Aid of Bilinear TransformationsIEEE Transactions on Reliability, 1972
- Automated Network Design-The Frequency-Domain CaseIEEE Transactions on Circuit Theory, 1969
- Fault Isolation in Conventional Linear SystemsߞA Feasibility StudyIEEE Transactions on Reliability, 1966
- Conditions for Network-Element-Value SolvabilityIRE Transactions on Circuit Theory, 1962