Application of the bond valence method to Si/NiSi2 interfaces
- 1 November 1991
- journal article
- Published by Springer Nature in Journal of Materials Research
- Vol. 6 (11) , 2371-2374
- https://doi.org/10.1557/jmr.1991.2371
Abstract
It is shown how the bond valence method can be used to estimate expected interatomic distances in coherent interfaces. The method is illustrated by application to the Si/NiSi2 (111) interface with results generally in accord with experimental data.Keywords
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