Measurement of Shot Noise in CdS Crystals

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Abstract
The noise power spectrum associated with photoconduction current in CdS crystals with indium electrodes is found to flatten off at low frequencies at a value that corresponds closely to the noise inherent in the photon absorption process itself plus that associated with the random nature of the carrier recombination process. It is found that the noise power is not a unique function of the photoconduction current, but varies as the square of the applied voltage, and linearly with light intensity, as suggested by a simple model not unlike that of the photomultiplier.