High quality interfaces in GaAs–AlAs quantum wells determined from high resolution photoluminescence
- 1 September 1997
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 15 (5) , 1703-1706
- https://doi.org/10.1116/1.589358
Abstract
High resolution photoluminescence (PL) measurements performed on several GaAs–AlAs quantum well structures revealed sharp excitonic transitions separated in energies corresponding to roughly half-monolayer fluctuations in well size. The narrow linewidths correlate with interface island structure whose lateral extent is either much larger or much smaller than the exciton diameter. The half-monolayer separation results from a sharply peaked PL intensity response occurring around those areas of the laterally nonuniform interface which have roughly 50% island coverage, with the average island size much smaller than the exciton diameter, about 225 Å.Keywords
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