Defect analysis, test generation and fault simulation for gate oxide shorts in CMOS ICs

Publisher Website

4 December 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iscas.1990.112567

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Built-in current testing-feasibility study
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
Gate oxide integrity of MOS/SOS devices
IEEE Transactions on Electron Devices, 1986